Contact
Comment faire ses achats
Livraison
Guide d'achat
Kelvin Probe Force Microscopy
From Single Charge Detection to Device Characterization
Anglais
683 b
Les clients ont également acheté
This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume "e;Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,"e; presents new and complementary topics.It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.
À propos du livre
Anglais
Catégories
Offrez ce livre dès aujourd'hui
C’est simple
1 Ajouter au panier et choisir l'option Livrer comme cadeau à la caisse. 2 Nous vous enverrons un bon d'achat 3 Le livre arrivera à l'adresse du destinataireCeci pourrait également vous intéresser
/
Livre de poche
58.69
€
/
Livre de poche
15.49
€
Bonjour ! Je suis Libroamiko, votre conseiller littéraire.
Comment puis-je vous aider ?