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VLSI Test Principles and Architectures: Design for Testability
Language
English
English
Book
Paperback
This book is a comprehensive guide to new DFT methods that will show the readers how to design a tes...
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Libristo code: 12234203
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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.
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About the book
Full name
VLSI Test Principles and Architectures: Design for Testability
Author
Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
Language
English
English
Binding
Book - Paperback
Date of issue
2006
Number of pages
808
EAN
9781493300860
ISBN
1493300865
Libristo code
12234203
Publishers
MORGAN KAUFMANN PUBL INC
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