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VLSI Design and Test

21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers

Language EnglishEnglish
Book Paperback
Book VLSI Design and Test Brajesh Kumar Kaushik
Libristo code: 18381771
Publishers Springer Verlag, Singapore, December 2017
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design an... Full description
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This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

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About the book

Full name VLSI Design and Test
Language English
Binding Book - Paperback
Date of issue 2017
Number of pages 815
EAN 9789811074691
ISBN 9811074690
Libristo code 18381771
Weight 1264
Dimensions 155 x 235 x 50
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