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Test and Diagnosis for Small-Delay Defects
Language
English
English
Book
Paperback
This book introduces new techniques for detecting and diagnosing small-delay defects in integrated c...
Libristo code: 09161362
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273 b
273 b
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This book introduces new techniques for detecting and diagnosing small-delay defects in integrated circuits. It details effective and scalable methodologies for screening and diagnosing small-delay defects.
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About the book
Full name
Test and Diagnosis for Small-Delay Defects
Language
English
English
Binding
Book - Paperback
Date of issue
2014
Number of pages
212
EAN
9781489989529
ISBN
9781489989529
Libristo code
09161362
Publishers
Springer-Verlag New York Inc.
Weight
361
Dimensions
155 x 235 x 235
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