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Semiconductor Material and Device Characterization 3e

Name: Semiconductor Material and Device Characterization 3e
Brand: John Wiley & Sons Inc
SKU: 01389606
Price: 261.99 EUR
Availability: InStock
Author: Dieter K. Schroder
ISBN: 9780471739067

Dieter K. Schroder

Language

English

Book Hardback

Libristo code: 01389606

Publishers John Wiley & Sons Inc, January 2006

Semiconductor Material and Device Characterization is the only book on the market devoted to the cha... Full description

Libristo code: 01389606

641 b

261.99 € VAT included

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Semiconductor Material and Device Characterization is the only book on the market devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices. It covers the full range of electrical and optical characterization methods while thoroughly treating the more specialized chemical and physical techniques. In the third edition, Professor Schroder has rewritten parts of each chapter and added two new chapters (Charge Based Measurements and Failure Analysis and Reliability), redrawn and updated most figures, and included new problems and approximately 100 new references.