Check order status

Become part of a community of book lovers from all over the world and get access to a whole bunch of benefits. Create an account for free

Austrian Post 5.49 € DPD courier 3.99 € DPD point 2.99 €

Contact

How to shop

Help

My account

▸ Empty :-(

Reflection Electron Microscopy and Spectroscopy for Surface Analysis

Name: Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Brand: Cambridge University Press
SKU: 02017914
Price: 73.39 EUR
Availability: InStock
Author: Zhong Lin Wang
ISBN: 9780521017954

Zhong Lin Wang

Language

English

Book Paperback

Libristo code: 02017914

Publishers Cambridge University Press, August 2005

In this book the theories, techniques and applications of reflection electron microscopy (REM), refl... Full description

Libristo code: 02017914

180 b

73.39 € VAT included

In stock at our supplier Shipping in 9-15 days

Delivery to Austria

30-day return policy

Customers also purchased

Jano i Wito. Magiczne słowa Wołoszyn Wiola

Hardback

7.49 €

Jane Eyre

Paperback

16.49 €

Hry šťastného dětství Aletha Solterová

Paperback

9.59 €

Sato Franz Kafka

Paperback

16.79 €

Encyclopedie de L'Islam Tome X T-U: Tome X T-U Th Bianquis

Hardback

2 049.19 €

In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.