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Noncontact Atomic Force Microscopy

Name: Noncontact Atomic Force Microscopy
Brand: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
SKU: 06617965
Price: 214.29 EUR
Availability: InStock
Author: E. Meyer
ISBN: 9783642627729

E. Meyer

S. Morita

Roland Wiesendanger

Language

English

Book Paperback

Libristo code: 06617965

Publishers Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, October 2012

Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based... Full description

Libristo code: 06617965

524 b

214.29 € VAT included

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Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. This method has the following characteristics: it has true atomic resolution; it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS); it can also be used to study insulators; and it can measure mechanical responses such as elastic deformation. This is the first book that deals with all of the emerging NC-AFM issues.