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Nanometer Variation-Tolerant SRAM
Circuits and Statistical Design for Yield
Language
English
English
Book
Hardback
This essential reference combines state-of-the-art circuit techniques and statistical methodologies...
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Libristo code: 01427061
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This essential reference combines state-of-the-art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. It shows designers how to apply practical techniques that optimize memory yield.
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About the book
Full name
Nanometer Variation-Tolerant SRAM
Author
Mohamed H. Abu-Rahma, Mohab Anis
Language
English
English
Binding
Book - Hardback
Date of issue
2012
Number of pages
172
EAN
9781461417484
ISBN
1461417481
Libristo code
01427061
Publishers
Springer-Verlag New York Inc.
Weight
4085
Dimensions
155 x 235 x 14
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