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Nanometer Technology Designs

High-Quality Delay Tests

Language EnglishEnglish
Book Paperback
Book Nanometer Technology Designs Nisar Ahmed
Libristo code: 01423022
Publishers Springer-Verlag New York Inc., December 2011
Traditional at-speed test methods cannot guarantee high quality test results as they face many new c... Full description
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Traditional at-speed test methods cannot guarantee high quality test results as they face many new challenges. Supply noise effects on chip performance, high test pattern volume, small delay defect test pattern generation, high cost of test implementation and application, and utilizing low-cost testers are among these challenges. This book discusses these challenges in detail and proposes new techniques and methodologies to improve the overall quality of the transition fault test.

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About the book

Full name Nanometer Technology Designs
Author Nisar Ahmed
Language English
Binding Book - Paperback
Date of issue 2011
Number of pages 281
EAN 9781441945594
ISBN 1441945598
Libristo code 01423022
Publishers Springer-Verlag New York Inc.
Weight 462
Dimensions 155 x 235 x 15

Categories

Technology, Engineering, Agriculture > Electronics & communications engineering > Electronics engineering > Electronics: circuits & components
Technology, Engineering, Agriculture > Technology: general issues > Engineering: general
Technology, Engineering, Agriculture > Technology: general issues > Nanotechnology
Technology, Engineering, Agriculture > Energy technology & engineering > Electrical engineering
Computing & Information Technology > Graphical & digital media applications > Computer-aided design (CAD)
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