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Multi-Chip Module Test Strategies

Name: Multi-Chip Module Test Strategies
Brand: Springer-Verlag New York Inc.
SKU: 06623159
Price: 107.29 EUR
Availability: InStock
Author: Yervant Zorian
ISBN: 9781461377986

Yervant Zorian

Language

English

Book Paperback

Libristo code: 06623159

Publishers Springer-Verlag New York Inc., October 2012

MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physica... Full description

Libristo code: 06623159

263 b

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MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. §Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. §Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2). §