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Dear customers, due to a public holiday, customer support is not available today. We will attend to your requests the next business day. Thank you for your understanding.
MOS Interface Physics, Process and Characterization
Language
English
English
Book
Paperback
The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important compo...
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Libristo code: 44702474
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The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.
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About the book
Full name
MOS Interface Physics, Process and Characterization
Author
Shengkai Wang, Xiaolei Wang
Language
English
English
Binding
Book - Paperback
Date of issue
2024
Number of pages
162
EAN
9781032106281
Libristo code
44702474
Publishers
Taylor & Francis Ltd
Weight
453
Dimensions
152 x 229
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