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Materials Reliability in Microelectronics III: Volume 309

Language EnglishEnglish
Book Paperback
Book Materials Reliability in Microelectronics III: Volume 309 Kenneth P. Rodbell
Libristo code: 02439136
Publishers Cambridge University Press, June 2014
The MRS Symposium Proceeding series is an internationally recognised reference suitable for research...
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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

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About the book

Full name Materials Reliability in Microelectronics III: Volume 309
Author Kenneth P. Rodbell, William F. Filter, Harold J. Frost, Paul S. Ho
Language English
Binding Book - Paperback
Date of issue 2014
Number of pages 514
EAN 9781107409484
ISBN 1107409489
Libristo code 02439136
Publishers Cambridge University Press
Weight 68
Dimensions 152 x 229 x 26

Categories

Technology, Engineering, Agriculture > Mechanical engineering & materials > Materials science
Technology, Engineering, Agriculture > Electronics & communications engineering > Electronics engineering
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