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Interfacial Compatibility in Microelectronics
Moving Away from the Trial and Error Approach
Language
English
English
Book
Paperback
This book provides solutions to several common reliability issues in microsystem packaging. It teach...
Libristo code: 02481545
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444 b
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This book provides solutions to several common reliability issues in microsystem packaging. It teaches the reader methods to understand and predict failure mechanisms at interfaces between dissimilar materials.§
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About the book
Full name
Interfacial Compatibility in Microelectronics
Language
English
English
Binding
Book - Paperback
Date of issue
2014
Number of pages
218
EAN
9781447160687
ISBN
1447160681
Libristo code
02481545
Publishers
Springer London Ltd
Weight
355
Dimensions
155 x 235 x 13
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