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Interfacial Compatibility in Microelectronics

Moving Away from the Trial and Error Approach

Language EnglishEnglish
Book Paperback
Book Interfacial Compatibility in Microelectronics Tomi Laurila
Libristo code: 02481545
Publishers Springer London Ltd, February 2014
This book provides solutions to several common reliability issues in microsystem packaging. It teach...
? points 394 b
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This book provides solutions to several common reliability issues in microsystem packaging. It teaches the reader methods to understand and predict failure mechanisms at interfaces between dissimilar materials.§

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