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High-Resolution X-Ray Scattering

From Thin Films to Lateral Nanostructures

Language EnglishEnglish
Book Paperback
Book High-Resolution X-Ray Scattering Ullrich Pietsch
Libristo code: 01421132
Publishers Springer-Verlag New York Inc., December 2011
The book presents a detailed description of high-resolution x-ray scattering methods suitable for th... Full description
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The book presents a detailed description of high-resolution x-ray scattering methods suitable for the investigation of the real structure of single-crystalline layers and multilayers, including structure defects in the layers and at the interfaces. Particular attention is devoted to lateral structures in semiconductors and semiconductor multilayers such as quantum wires and quantum dots. Both the theoretical background and the application of the methods are discussed. The second edition is extended to deal with lateral surface nanostructures such as gratings and dots, new examples for measuring layer thickness, lattice mismatch, and surface/interface roughness. The book will be an invaluable source for graduates and scientists.

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About the book

Full name High-Resolution X-Ray Scattering
Author Ullrich Pietsch, Vaclav Holy, Tilo Baumbach
Language English
Binding Book - Paperback
Date of issue 2011
Number of pages 408
EAN 9781441923073
ISBN 1441923071
Libristo code 01421132
Publishers Springer-Verlag New York Inc.
Weight 652
Dimensions 155 x 235 x 24

Categories

Mathematics & Science > Chemistry > Physical chemistry > Surface chemistry & adsorption
Technology, Engineering, Agriculture > Electronics & communications engineering > Electronics engineering > Electronic devices & materials
Technology, Engineering, Agriculture > Other technologies & applied sciences > Applied optics > Laser technology & holography
Mathematics & Science > Physics > Materials / States of matter
Technology, Engineering, Agriculture > Technology: general issues > Nanotechnology
Technology, Engineering, Agriculture > Mechanical engineering & materials > Materials science
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