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Encyclopedia of Scanning Electron Microscopy

Language EnglishEnglish
Book Hardback
Book Encyclopedia of Scanning Electron Microscopy Lisa Page
Libristo code: 12434373
Publishers NY RESEARCH PRESS, January 2015
This book focuses on various issues concerned with scanning electron microscopy, as well as its theo... Full description
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This book focuses on various issues concerned with scanning electron microscopy, as well as its theoretical and practical applications. Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. Numerous topics are covered under two sections "Instrumentation, Methodology" and "Biology, Medicine" for electronic industry. This book includes contributions by renowned researchers and experts in this field.

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About the book

Full name Encyclopedia of Scanning Electron Microscopy
Author Lisa Page
Language English
Binding Book - Hardback
Date of issue 2015
Number of pages 324
EAN 9781632381668
ISBN 1632381664
Libristo code 12434373
Publishers NY RESEARCH PRESS
Weight 616
Dimensions 237 x 162 x 2
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