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Defects in Microelectronic Materials and Devices
Language
English
English
Book
Hardback
Presents a survey of defects that occur in silicon-based metal-oxide semiconductor field-effect tran...
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Libristo code: 06681094
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Presents a survey of defects that occur in silicon-based metal-oxide semiconductor field-effect transistor (MOSFET) technologies. This book discusses flaws in linear bipolar technologies, silicon carbide-based devices, and gallium arsenide materials and devices.
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About the book
Full name
Defects in Microelectronic Materials and Devices
Author
Daniel M. Fleetwood
Language
English
English
Binding
Book - Hardback
Date of issue
2008
Number of pages
770
EAN
9781420043761
ISBN
9781420043761
Libristo code
06681094
Publishers
Taylor & Francis Inc
Weight
1520
Dimensions
185 x 260 x 42
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