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Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces
Language
English
English
Book
Paperback
This book offers results that influence many high temperature and pressure applications. It provides...
Libristo code: 01427604
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249 b
249 b
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This book offers results that influence many high temperature and pressure applications. It provides findings that will offer increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.
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About the book
Full name
Atomic Scale Characterization and First-Principles Studies of Si3N4 Interfaces
Author
Weronika Walkosz
Language
English
English
Binding
Book - Paperback
Date of issue
2013
Number of pages
110
EAN
9781461428572
ISBN
1461428572
Libristo code
01427604
Publishers
Springer-Verlag New York Inc.
Weight
203
Dimensions
155 x 235 x 8
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