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Atomic Force Microscopy - Understanding Basic Modes and Advanced Applications

Language EnglishEnglish
Book Hardback
Book Atomic Force Microscopy - Understanding Basic Modes and Advanced Applications Greg Haugstad
Libristo code: 01388618
Publishers John Wiley & Sons Inc, October 2012
This book enlightens readers on the basic surface properties and distance-dependent intersurface for... Full description
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This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.§"Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com"

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About the book

Full name Atomic Force Microscopy - Understanding Basic Modes and Advanced Applications
Author Greg Haugstad
Language English
Binding Book - Hardback
Date of issue 2012
Number of pages 496
EAN 9780470638828
ISBN 0470638826
Libristo code 01388618
Weight 850
Dimensions 155 x 243 x 32
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