Contact
How to shop
Delivery
Shopping guide
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Application to Rough and Natural Surfaces
English
507 b
Delivery to Austria
Up to 30 days for returns
Customers also purchased
Paperback
65.59
€
/
Paperback
20.69
€
/
Paperback
25.69
€
/
Paperback
48.69
€
/
Paperback
38.00
€
Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.
About the book
English
Give this book today
It's easy
1 Add to cart and choose Deliver as present at the checkout 2 We'll send you a voucher 3 The book will arrive at the recipient's addressYou might also be interested in
/
Hardback
27.39
€
/
Paperback
39.49
€
Hi! I'm Libroamiko, your book advisor.
How can I help you?