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Analog IC Reliability in Nanometer CMOS
Language
English
English
Book
Paperback
This book covers modeling, simulation and analysis of analog circuit aging, nanometer CMOS physical...
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Libristo code: 09479806
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This book covers modeling, simulation and analysis of analog circuit aging, nanometer CMOS physical effects resulting in unreliability, transistor aging compact models for circuit simulation, methods for efficient circuit reliability simulation and more.
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About the book
Full name
Analog IC Reliability in Nanometer CMOS
Author
Elie Maricau, Georges Gielen
Language
English
English
Binding
Book - Paperback
Date of issue
2015
Number of pages
198
EAN
9781489986306
ISBN
1489986308
Libristo code
09479806
Publishers
Springer-Verlag New York Inc.
Weight
3343
Dimensions
155 x 235 x 11
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